The uncertainty of international metrology

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TypeArticle
ConferenceNCSL International 2000 Workshop and Symposium : metrology, intangible, imbedded support? : conference proceedings, July 16-20, 2000, Toronto, Ontario, Canada
Pages6 p.
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; National Research Council Canada
Peer reviewedNo
NRC number826
NPARC number5763473
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Record identifier0018ca02-a0be-43eb-ab15-d5da65da24fe
Record created2009-03-29
Record modified2016-05-09
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