Fourier Transform aroach forthe estimation of optical thin film thickness

Alternative titleTechnical Digest
AuthorSearch for:
TypeArticle
ConferenceTopical Meeting on Optical Interference Coatings, Washington, DC
PagesTuA91
PublisherOptical Society of America
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12346787
Export citationExport as RIS
Report a correctionReport a correction
Record identifier01b5e35a-2bf4-4efc-8bbd-bc228961cba1
Record created2009-09-17
Record modified2016-05-09
Bookmark and share
  • Share this page with Facebook (Opens in a new window)
  • Share this page with Twitter (Opens in a new window)
  • Share this page with Google+ (Opens in a new window)
  • Share this page with Delicious (Opens in a new window)