Comparison of InGaAs MOSFETs with Germanium-on-Insulator CMOS

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DOIResolve DOI: http://doi.org/10.1016/j.mssp.2006.08.066
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TypeArticle
Journal titleMaterials Science in Semiconductor Processing
Volume9
Issue4-5
Pages711715; # of pages: 5
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12743779
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Record identifier085385d2-0c69-4a9f-a285-3cfb0c6bf0c8
Record created2009-10-27
Record modified2016-05-09
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