Method and apparatus for layer thickness measurement

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TypeTechnical Report
Series titleUnited States Patent Application
AbstractA technique for optical measurement of a thickness of a layer on a surface uses diffuse reflections at opposite boundaries of the layer, operates on transparent, or translucent layers. The thickness is determined by computing a separation between the centers of the two diffuse reflections, and using the index of refraction of the layer, and geometric properties of a beam and detector with respect to the surface. The technique is useful for quantifying thickness of a layer of rime ice, glaze ice, frosted ice, or water, for example.
Publication date
AffiliationNRC Institute for Ocean Technology; National Research Council Canada
Peer reviewedNo
IdentifierIR-2006-18
NRC number6361
NPARC number8895003
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Record identifier0b62a739-764a-4e4b-9efd-cd5161e1a9fe
Record created2009-04-22
Record modified2016-05-09
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