Structural changes in amorphous silicon studied by X-ray photoemission spectroscopy: a phenomenon 109, independent of the Staebler-Wronski effect?

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DOIResolve DOI: http://doi.org/10.1016/S0022-3093(01)00339-8
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TypeArticle
Journal titleJournal of Non-Crystalline Solids
Volume282
Issue2-3
Pages165172; # of pages: 8
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12743934
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Record identifier0c3f673d-66dc-40aa-9b63-057b4226ba69
Record created2009-10-27
Record modified2016-05-09
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