Convenient contrast enhancement by hole-free phase plate in a TEM

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DOIResolve DOI: http://doi.org/10.1017/S1431927610055807
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TypeArticle
Proceedings titleMicroscopy and Microanalysis
ConferenceMicroscopy and Microanalysis 2010, 1-5 August 2010, Portland, Oregon, USA
ISSN1435-8115
Volume16
IssueSupplement S2
Pages526527; # of pages: 2
Publication date
PublisherCambridge University Press
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number21268170
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Record identifier0e80605f-4245-45f8-859b-10f4df491f50
Record created2013-05-16
Record modified2016-05-09
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