Thermal stability of sulfur passivated InP(100)-(1×1)

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DOIResolve DOI: http://doi.org/10.1063/1.112662
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TypeArticle
Journal titleApplied Physics Letters
Volume65
Issue2
Pages171173; # of pages: 3
Subjectauger effect; evaporation; indium phosphides; leed; passivation; sem; stability; sulfur additions; surface reconstruction; thermal testing
AbstractAuger electron spectroscopy, low-energy electron diffraction, thermal desorption spectroscopy, and scanning electron microscopy have been utilized to investigate the thermal stability of S-passivated InP(100). S-passivated InP(100) is shown to be thermally stable up to ~730 K, where S removal and sample evaporation begins. This evaporation results in the formation of a roughened, but clean, InP(100) surface, showing the characteristic (4×2) reconstruction.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; NRC Institute for Microstructural Sciences
Peer reviewedNo
NPARC number12329040
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Record identifier0ece4f5b-2600-436f-af74-34282f03f5a2
Record created2009-09-10
Record modified2016-05-09
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