Silicon-chip-based real-time dispersion monitoring for 640 Gbit/s DPSK signals

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DOIResolve DOI: http://doi.org/10.1109/JLT.2011.2141974
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TypeArticle
Journal titleJournal of Lightwave Technology
Volume29
Issue12
Pages17901796; # of pages: 7
Subjectnonlinear optics; optical performance monitoring (OPM); optical planar waveguides; optical signal processing; spectral analysis
AbstractWe demonstrate silicon-chip-based instantaneous chromatic dispersion monitoring (GVD) for an ultrahigh bandwidth 640 Gbit/s differential phase-shift keying (DPSK) signal. This monitoring scheme is based on cross-phase modulation in a highly nonlinear silicon nanowire. We show that two-photon absorption and free-carrier-related effects do not compromise the GVD monitoring performance, making our scheme a reliable on-chip CMOS-compatible, all-optical, and real-time impairment monitoring approach for up to Terabit/s DPSK signals.
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LanguageEnglish
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedYes
NPARC number19577557
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Record identifier0f068f69-b397-49dc-8f20-ed96f7d4ae68
Record created2012-02-29
Record modified2016-05-09
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