Quantitative characterization of surface defects and composition on PtRu nanoparticles using aberration-corrected TEM/STEM

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DOIResolve DOI: http://doi.org/10.1017/S1431927609094744
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TypeArticle
Proceedings titleMicroscopy and Microanalysis
ConferenceMicroscopy and Microanalysis 2009, 26-30 July 2009, Richmond, Virginia, USA
Volume15
IssueS2
Pages14161417; # of pages: 2
Publication date
PublisherCambridge University Press
LanguageEnglish
AffiliationNational Research Council Canada (NRC-CNRC); NRC Institute for Chemical Process and Environmental Technology
Peer reviewedYes
NRC number52056
NPARC number16054741
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Record identifier0f5aad51-3d5c-49e9-bf97-7b9c603ad6b0
Record created2010-09-21
Record modified2016-05-09
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