Birefringence Control Using Stress Engineering for Silicon-on-insulator (SOI) Waveguides

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DOIResolve DOI: http://doi.org/10.1109/JLT.2005.843518
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TypeArticle
Journal titleJournal of Lightwave Technology
Volume23
Issue3
Pages13081318; # of pages: 11
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744083
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Record identifier100648c9-0246-41bb-9235-c27349afae4f
Record created2009-10-27
Record modified2016-05-09
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