Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy

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DOIResolve DOI: http://doi.org/10.1103/PhysRevLett.94.056802
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TypeArticle
Journal titlePhysical Review Letters
Volume94
Issue5
Pages5680256805; # of pages: 4
AbstractSingle-electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic-force microscope (AFM). The resonant frequency shift and the dissipated energy of an oscillating AFM cantilever were measured as a function of the tip-back electrode voltage, and the resulting spectra show distinct jumps when the tip was positioned above the dot. The observed jumps in the frequency shift, with corresponding peaks in dissipation, are attributed to a single-electron tunneling between the dot and the back electrode governed by the Coulomb blockade effect, and are consistent with a model based on the free energy of the system. The observed phenomenon may be regarded as the “force version” of the Coulomb blockade effect.
Publication date
AffiliationNational Research Council Canada; NRC Institute for Microstructural Sciences
Peer reviewedNo
NPARC number12744336
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Record identifier1186c53d-0d57-4504-9021-8cf72c501433
Record created2009-10-27
Record modified2016-05-09
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