In-SITU monitoring of residual stress development during E-beam processing

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Proceedings titleSAMPE 2004/Long Beach : Materials and Processing Technology - 60 Years of SAMPE Progress
ConferenceSAMPE 2004 - 49th International SAMPE Symposium : Long Beach, CA, May 16-20, 2004
SubjectE-beam cure; testing equipment; post-cure; dimensional stability
Publication date
PublisherSociety for the Advancement of Material and Process Engineering
AffiliationNRC Institute for Aerospace Research; National Research Council Canada
Peer reviewedNo
NPARC number8931598
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Record identifier11930702-2d5d-48c3-9470-e3cfdcb230d2
Record created2009-04-23
Record modified2016-05-09
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