Degradation mechanism at XLPE/semicon interface subjected to high electrical stress

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DOIResolve DOI: http://doi.org/10.1109/14.78329
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TypeArticle
Journal titleIEEE transactions on electrical insulation
ISSN0018-9367
Volume26
IssueApril 2
Pages278284; # of pages: 7
Publication date
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards
Peer reviewedNo
Identifier10128876
NRC number1628
NPARC number8898698
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Record identifier1713dea3-e9f1-41f9-a52c-bb7609eed2e5
Record created2009-04-22
Record modified2016-05-09
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