Cs corrected bright field imaging of radiation sensitive materials

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DOIResolve DOI: http://doi.org/10.1017/S1431927605501053
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TypeArticle
Journal titleMicroscopy and Microanalysis
Volume11
IssueS02
Pages21502151; # of pages: 2
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; National Institute for Nanotechnology
Peer reviewedYes
NRC number41
NPARC number12338418
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Record identifier17a4f602-a765-46db-ba6b-d1f298d8fc36
Record created2009-09-10
Record modified2016-05-09
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