Low-background single-crystal silicon sample holders for neutron powder diffraction

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DOIResolve DOI: http://doi.org/10.1107/S0021889807011387
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TypeArticle
Journal titleJournal Of Applied Crystallography
ISSN0021-8898
Volume40
Issue3
Pages489495; # of pages: 7
Subjectneutron powder diffraction; sample holders; null-scattering materials; low background
AbstractNeutron diffraction measurements on weakly scattering or highly absorbing samples may demand custom mounting solutions. Two low-background sample holders based on inexpensive single-crystal silicon are described. One uses a conventional cylindrical geometry and is optimized for weakly scattering materials, while the other has a large-area flat-plate geometry and is designed for use with highly absorbing samples. Both holders yield much lower backgrounds than more conventional null-matrix or null-scattering materials and are essentially free from interfering Bragg peaks.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; NRC Canadian Neutron Beam Centre
Peer reviewedNo
NPARC number12338243
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Record identifier1922cfc7-67ef-4a5a-98aa-853139b54e11
Record created2009-09-10
Record modified2016-05-09
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