Patterson analysis for layer profile determination by neutron or X-ray reflectometry

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DOIResolve DOI: http://doi.org/10.1107/S0021889812015075
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TypeArticle
Journal titleJournal of Applied Crystallography
ISSN0021-8898
Volume45
Issue3
Pages398405; # of pages: 8
Subjectneutron reflectometry; X-ray reflectometry; layer profile determination; Patterson analysis
AbstractThe possibility of using Patterson analysis to interpret neutron or X-ray reflectometry data has been critically examined in terms of a hypothetical case study. The technique yields a highly accurate layer profile model provided the data are measured with a beam geometry that gives rise to unit reflectivity at Q = 0 only, i.e. Qc = 0. For those cases where a plateau of unit reflectivity extends out to finite Q, i.e. Qc > 0, a distorted model is obtained. A strategy to significantly improve this initial estimate of the model is proposed and demonstrated.
Publication date
PublisherWiley
LanguageEnglish
AffiliationNRC Canadian Neutron Beam Centre; National Research Council Canada
Peer reviewedYes
NPARC number21268028
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Record identifier1a834bae-f4d6-4009-adf4-de0f72c4d48b
Record created2013-04-04
Record modified2016-05-09
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