Microscopy of pentacene thin films

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DOIResolve DOI: http://doi.org/10.1080/14786430600953756
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Journal titlePhilosophical Magazine
Pages253266; # of pages: 14
AbstractThin films of pentacene were deposited by vacuum sublimation onto amorphous carbon, glass, silicon and mica substrates, then characterized by X-ray and electron diffraction, transmission electron microscopy (TEM) and atomic-force microscopy (AFM). Sub-monolayer films consist of dendritic islands, which change to more compact fractal shapes upon transforming to a multilayer structure (with decrease in surface area) prior to complete coverage of the substrate. Increased crystallite size was obtained by heating the substrate during deposition and by post-deposition annealing. Irradiation with 200-keV electrons was found to destroy the crystallinity of the films after a dose of 0.6 C/cm2 (or 2 C/cm2 if the specimen is cooled to 90 K during TEM observation). We argue that, despite this moderate radiation sensitivity, TEM under near-optimal conditions can image monolayers of pentacene with sub-nm resolution.
Publication date
PublisherTaylor & Francis
AffiliationNational Research Council Canada; National Institute for Nanotechnology
Peer reviewedYes
NRC number206
NPARC number12329210
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Record identifier1b5fca4e-8b7c-40f8-9131-516d1254abf7
Record created2009-09-10
Record modified2016-05-09
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