Evaluation of uncertainty in grating pitch measurement by optical diffraction using Monte Carlo methods

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DOIResolve DOI: http://doi.org/10.1088/0957-0233/22/2/027001
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TypeArticle
Journal titleMeasurement Science and Technology
Volume22
Issue2
Pages027001-1027001-6; # of pages: 6
Subjectgrating; pitch; nanoscale; metrology; nanometrology; diffractometer; diffraction; calibration; Monte Carlo; refractive index of air; atomic force microscope; scanning probe microscope; scanning electron microscope
AbstractMeasurement of grating pitch by optical diffraction is one of the few methods currently available for establishing traceability to the definition of the meter on the nanoscale; therefore, understanding all aspects of the measurement is imperative for accurate dissemination of the SI meter. A method for evaluating the component of measurement uncertainty associated with coherent scattering in the diffractometer instrument is presented. The model equation for grating pitch calibration by optical diffraction is an example where Monte Carlo (MC) methods can vastly simplify evaluation of measurement uncertainty. This paper includes discussion of the practical aspects of implementing MC methods for evaluation of measurement uncertainty in grating pitch calibration by diffraction. Downloadable open-source software is demonstrated.
Publication date
PublisherIOP Science
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; National Research Council Canada
Peer reviewedYes
NPARC number21268135
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Record identifier1bf37c29-ef8c-49b4-9873-c89e391b150d
Record created2013-05-08
Record modified2016-05-09
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