Fourier transform technique with frequency filtering for optical thin-film design

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DOIResolve DOI: http://doi.org/10.1364/AO.34.000688
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TypeArticle
Journal titleApplied Optics
Volume34
Issue4
Pages688694; # of pages: 7
AbstractA Fourier analysis of existing and potentially complex refractive index profiles is often useful in the resolution of thin-film design problems. Applications of a frequency-filtering technique, which consists of the suppression of undesired spatial frequencies from the refractive index profiles, are described. A new, extremely simple antireflection coating synthesis method based on this concept is proposed.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; NRC Institute for Microstructural Sciences
Peer reviewedNo
NPARC number12330248
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Record identifier1c764e78-fd0f-4de9-9183-714ecfb59c8f
Record created2009-09-10
Record modified2016-05-09
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