Raman Spectroscopy of Si Nanocrystals in Nanocrystalline Si Superlattices: Size, Shape and Crystallographic Orientation

Alternative titleMicrocrystalline and Nanocrystalline Semiconductors–2000
AuthorSearch for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for:
EditorSearch for: Jr, B.; Search for: Fauchet, P.; Search for: Buriak, J.; Search for: Canham, L.; Search for: Koshida, N.
TypeArticle
Volume638
PagesF611
Publication date
PublisherMRS
PlacePittsburgh, PA
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada; NRC Institute for National Measurement Standards
Peer reviewedNo
NPARC number12346693
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Record identifier1e489efc-418d-4570-bbad-edb498f2ed0e
Record created2009-09-17
Record modified2016-05-09
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