Implementation of long-wavelength cut-off filters based on critical angle

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DOIResolve DOI: http://doi.org/10.1364/AO.50.00C396
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TypeArticle
Journal titleApplied Optics
Volume50
Issue9
PagesC396C402; # of pages: 6
AbstractOur first attempts at the fabrication of long-wavelength infrared cut-off filters with extended transmission and rejection regions that are based on the use of the critical angle, the dispersion of refractive indices, and on thin-film interference were not very successful. The design of the filter consisted of layers placed at the interface between two high-index prisms. Using the available deposition equipment, the layers produced were porous and very rough. The pores adsorbed water vapor, which resulted in absorption. The roughness made the process of optical contacting very difficult. In this paper we describe the adjustments in the design and deposition processes that allowed us to obtain filters with a better and more stable performance.
Publication date
PublisherOptical Society of America
LanguageEnglish
AffiliationNational Research Council Canada; NRC Institute for Microstructural Sciences
Peer reviewedYes
NPARC number17453110
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Record identifier1f519471-321a-4491-b967-2ddc157e341d
Record created2011-03-26
Record modified2016-05-09
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