Characterization of glancing angle deposition thin film optical filters with engineered index profiles

TypeArticle
Publication date
Linkhttp://www.mrs.org/s_mrs/sec_subscribe.asp?CID=6439&DID=175474&action=detail
AffiliationNRC National Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NRC number269
NPARC number8926139
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Record identifier208be9a7-9702-4ea3-a469-93f5ba17bc17
Record created2009-04-23
Record modified2016-05-09
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