αRAM: an α particle detecting MOS IC for radon monitoring

DOIResolve DOI: http://doi.org/10.1109/MNRC.2008.4683381
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TypeArticle
Proceedings title2008 1st Microsystems and Nanoelectronics Research Conference
Conference2008 1st Microsystems and Nanoelectronics Research Conference (MNRC 2008), October 15, 2008, Ottawa, ON, Canada
ISBN978-1-4244-2920-2
Pages7376
AbstractA custom integrated circuit (“αRAM”) capable of detecting the α particles emitted in the decay of radon and its progeny has been designed, fabricated and successfully tested. The αRAM has been incorporated in a complete radon monitor using electrostatic concentration of radon progeny. The monitor can detect hazardous levels of radon within hours.
Publication date
PublisherIEEE
LanguageEnglish
AffiliationNational Research Council Canada
Peer reviewedYes
NRC publication
This is a non-NRC publication

"Non-NRC publications" are publications authored by NRC employees prior to their employment by NRC.

NPARC number23001039
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Record identifier20a740f7-344f-4255-9894-f849d1c8ccd8
Record created2016-12-02
Record modified2016-12-02
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