Inspection of hard-to-reach industrial parts using small-diameter probes

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DOIResolve DOI: http://doi.org/10.1117/2.1200610.0467
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TypeArticle
Proceedings titleProceedings of the SPIE
ConferencePhotonics North 2006, Quebec City, Quebec, June 05-08, 2006
ISBN0819464287
Publication date
PublisherSociety of Photo Optical
LanguageEnglish
AffiliationNational Research Council Canada (NRC-CNRC); NRC Industrial Materials Institute
Peer reviewedNo
NRC number48959
NPARC number15905571
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Record identifier23cfe0db-7543-4fb8-bdd1-403f5b36efa9
Record created2010-08-17
Record modified2016-05-09
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