A quantum trap MONOS memory device using AlN

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DOIResolve DOI: http://doi.org/10.1149/1.2208742
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TypeArticle
Journal titleJournal of The Electrochemical Society
Volume153
Issue8
PagesG738
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744117
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Record identifier24133433-0dff-4453-995c-70954e2a3eaf
Record created2009-10-27
Record modified2016-05-09
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