A single trapped strontium ion: a first step towards an improved frequency standard

DOIResolve DOI: http://doi.org/10.1109/CPEM.1990.110020
AuthorSearch for: ; Search for:
TypeArticle
ConferenceCPEM '90 digest : Conference on Precision Electromagnetic Measurements, June 11-14, 1990, Ottawa, Ontario, Canada
Pages272273; # of pages: 2
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards
Peer reviewedNo
NRC number4441
NPARC number8899243
Export citationExport as RIS
Report a correctionReport a correction
Record identifier2449c736-3cf9-4de7-9cf3-bfa3a18a416d
Record created2009-04-22
Record modified2016-05-09
Bookmark and share
  • Share this page with Facebook (Opens in a new window)
  • Share this page with Twitter (Opens in a new window)
  • Share this page with Google+ (Opens in a new window)
  • Share this page with Delicious (Opens in a new window)