Bandpass filter implemented with blazed waveguide sidewall gratings in silicon-on-insulator

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DOIResolve DOI: http://doi.org/10.1049/el.2012.0591
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TypeArticle
Journal titleElectronics Letters
ISSN00135194
Volume48
Issue12
Pages715717
AbstractThe fabrication and experimental characterisation of a two-stage band-pass filter based on curved waveguide sidewall gratings is reported for the silicon-on-insulator platform. At each cascaded filtering stage, the spectral components of the input signal are dispersed by the diffraction grating formed in the sidewall of a silicon strip waveguide. Different wavelengths are focused onto different positions along the Rowland circle and the filter central wavelength is selected by a specific receiver waveguide. By using two consecutive filtering stages, both the filter passband profile and the stopband rejection ratio are substantially increased. The grating is apodised and chirped to ensure a constant effective index along the grating length to minimise phase distortions. Blazed geometry is used to maximise the diffraction efficiency to the −1st order. The device was fabricated with electron beam lithography and reactive ion etching using a single etch step. A bandwidth of 6.2 nm was measured near 1590 nm for the fabricated filter, with a roll-off of 4 dB/nm at the passband edge, and a stopband rejection of 40 dB.
Publication date
LanguageEnglish
AffiliationInformation and Communication Technologies; National Research Council Canada
Peer reviewedYes
NPARC number21268969
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Record identifier25b39436-15d1-4c80-9e9e-1425999a8689
Record created2013-11-28
Record modified2016-05-09
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