Infrared spectroscopy of self-assembled monolayer films on silicon

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DOIResolve DOI: http://doi.org/10.1016/j.susc.2006.11.071
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TypeArticle
Journal titleSurface science
Volume601
Issue13
Pages25662570; # of pages: 5
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744521
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Record identifier2ab943f9-7432-4903-be44-e4777c5a1ed7
Record created2009-10-27
Record modified2016-05-09
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