3D imaging of Si and Er nanoclusters in Er doped SiO1.5 films by STEM tomography

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DOIResolve DOI: http://doi.org/10.1017/S1431927609093143
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TypeArticle
Proceedings titleMicroscopy and Microanalysis
ConferenceMicroscopy and Microanalysis 2009, July 26-30, 2009, Richmond, Virginia, USA
Volume15
IssueSuppl. 2
Pages12561257; # of pages: 2
Publication date
PublisherCambridge University Press
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number19739589
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Record identifier2b7ef35c-0af0-4e41-a668-aa30b255bac5
Record created2012-04-19
Record modified2016-05-25
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