Low-energy electron point projection microscopy of suspended graphene, the ultimate 'microscope slide'

Download
  1. Get@NRC: Low-energy electron point projection microscopy of suspended graphene, the ultimate 'microscope slide' (Opens in a new window)
DOIResolve DOI: http://doi.org/10.1088/1367-2630/13/6/063011
AuthorSearch for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for:
TypeArticle
Journal titleNew Journal of Physics
ISSN1367-2630
Volume13
Article number63011
SubjectCovalent radii; Electron emitters; Electron transmission; Image objects; Knife edge; Low energies; Low energy electrons; Microscope slide; Nano-scale objects; Point projection; Strong field; Virtual sources; Electron beams; Electron holography; Electrons; Graphene
AbstractPoint projection microscopy (PPM) is used to image suspended graphene by using low-energy electrons (100-205 eV). Because of the low energies used, the graphene is neither damaged nor contaminated by the electron beam for doses of the order of 107 electrons per nm2. The transparency of graphene is measured to be 74%, equivalent to electron transmission through a sheet twice as thick as the covalent radius of sp2-bonded carbon. Also observed is rippling in the structure of the suspended graphene, with a wavelength of approximately 26 nm. The interference of the electron beam due to diffraction off the edge of a graphene knife edge is observed and is used to calculate a virtual source size of 4.7 ± 0.6 Å for the electron emitter. It is demonstrated that graphene can serve as both the anode and the substrate in PPM, thereby avoiding distortions due to strong field gradients around nanoscale objects. Graphene can be used to image objects suspended on the sheet using PPM and, in the future, electron holography. © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada (NRC-CNRC); National Institute for Nanotechnology (NINT-INNT)
Peer reviewedYes
NPARC number21271410
Export citationExport as RIS
Report a correctionReport a correction
Record identifier2eabda7f-a7ca-42c8-8856-74bdf2ca315e
Record created2014-03-24
Record modified2016-05-09
Bookmark and share
  • Share this page with Facebook (Opens in a new window)
  • Share this page with Twitter (Opens in a new window)
  • Share this page with Google+ (Opens in a new window)
  • Share this page with Delicious (Opens in a new window)