Current gain degradation in SiGe HBTs by hot carriers

Download
  1. Get@NRC: Current gain degradation in SiGe HBTs by hot carriers (Opens in a new window)
DOIResolve DOI: http://doi.org/10.1116/1.1503789
AuthorSearch for: ; Search for: ; Search for: ; Search for:
TypeArticle
Journal titleJournal of Vacuum Science & Technology B
Volume20
Issue5
Pages19611966; # of pages: 6
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744495
Export citationExport as RIS
Report a correctionReport a correction
Record identifier2eed0044-2e99-47ee-935e-b8aa4fb5c01a
Record created2009-10-27
Record modified2016-05-09
Bookmark and share
  • Share this page with Facebook (Opens in a new window)
  • Share this page with Twitter (Opens in a new window)
  • Share this page with Google+ (Opens in a new window)
  • Share this page with Delicious (Opens in a new window)