In-situ Monitoring of Residual Stress Development During E-Beam Processing - ABSTRACT ONLY

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TypeArticle
ConferenceSAMPE 2004 - 49th International SAMPE Symposium From 5/18/2004 To 5/20/2004, Long Beach, CA
SubjectComposites; Polymers; Electron Beam Curing; Process Modelling
AffiliationNRC Institute for Aerospace Research; National Research Council Canada
Access conditionavailable
unclassified
unlimited
Peer reviewedYes
NRC numberSMPL-2003-0292
NPARC number8933344
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Record identifier2f3d4102-3daf-44bc-bf0e-d33fee67735e
Record created2009-04-23
Record modified2016-05-09
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