Convenient electron optics set up for Zernike phase microscopy in TEM

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DOIResolve DOI: http://doi.org/10.1017/S1431927609094598
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TypeArticle
Proceedings titleMicroscopy and Microanalysis
ConferenceMicroscopy and Microanalysis 2009, 26-30 July 2009, Richmond, Virginia, USA
Volume15
IssueSupplement S2
Pages12341235; # of pages: 2
Publication date
PublisherCambridge University Press
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number19739588
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Record identifier2fc7a69e-7f9c-4f7b-88c3-b17ba2599355
Record created2012-04-19
Record modified2016-05-09
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