Electrical conduction in sputtered Si:Al films

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DOIResolve DOI: http://doi.org/10.1016/0038-1098(83)90498-2
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TypeArticle
Journal titleSolid state communications
ISSN0038-1098
Volume47
IssueAugust 7
Pages555558; # of pages: 4
Publication date
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; NRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
Identifier10111086
NRC number2461
NPARC number8899043
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Record identifier325102b9-213f-4293-b596-6ef2f22ddec3
Record created2009-04-22
Record modified2016-05-09
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