Measuring phonon dephasing with ultrafast pulses using Raman spectral interference

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DOIResolve DOI: http://doi.org/10.1103/PhysRevB.78.155201
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TypeArticle
Journal titlePhysical Review B
ISSN1098-0121
Volume78
Issue15-15
Pages155201-1155201-6
AbstractA technique to measure the decoherence time of optical phonons in a solid is presented. Phonons are excited with a pair of time-delayed 80 fs near infrared pulses via spontaneous transient Raman scattering. The spectral fringe visibility of the resulting Raman pulse pair, as a function of time delay, is used to measure the phonon dephasing time. The method avoids the need to use either narrow band or few femtosecond pulses and is useful for low phonon excitations. The dephasing time of phonons created in bulk diamond is measured to be τ=6.8 ps (Δν=1.56 cm−1).
Publication date
LanguageEnglish
Peer reviewedYes
NPARC number21277122
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Record identifier332e3708-0417-4572-92d4-7dd704666724
Record created2015-12-03
Record modified2016-05-09
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