Crossover between hopping and tunnelling conduction in Au-SiO2 films [Letter]

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DOIResolve DOI: http://doi.org/10.1088/0022-3719/17/28/007
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TypeArticle
Journal titleJournal of physics. C. Solid state physics
ISSN00223719
Volume17
IssueOctober 10, 28
PagesL751L755
Publication date
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; NRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
Identifier10276993
NRC number2465
NPARC number8900616
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Record identifier3618fa28-c4db-4689-8c08-ad7f3e95d7ab
Record created2009-04-22
Record modified2016-05-09
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