New measurements of the elastic properties of composition modulated Cu-Ni thin films

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DOIResolve DOI: http://doi.org/10.1063/1.103034
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TypeArticle
Journal titleApplied Physics Letters
ISSN0003-6951
Volume56
Issue20
Pages19591961; # of pages: 3
Subjectthin film composition; ultrasonics; elastic moduli; elasticity
AbstractUsing a new ultrasonic method which relies on the measurement of the in-phase and quadrature components of a continuous ultrasonic excitation as a function of position, we have measured the flexural modulus of composition modulated Cu-Ni self-supporting thin films. For some of the films, we have also observed the shear (S z ) modulus (allowing the calculation of the biaxial and Young’s moduli). No enhancement of these moduli was observed for composition wavelengths in the range of 17–40 Å.
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LanguageEnglish
Peer reviewedYes
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NPARC number21273071
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Record identifier37e97c1d-782a-4d00-8d75-6eafbe89308f
Record created2014-12-11
Record modified2016-05-09
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