Femtosecond laser desorption of ultrathin polymer films from a dielectric surface

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DOIResolve DOI: http://doi.org/10.1063/1.4817816
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TypeArticle
Journal titleApplied Physics Letters
ISSN0003-6951
Volume103
Issue6
Pages061107-01061107-04
AbstractBy focusing femtosecond pulses on the front and rear surface of a fused silica coverslip, we desorb 8-nm thick polymer films at submicron scale. To determine the role of the substrate in the desorption process, we measure the threshold for nonlinear absorption in fused silica and compare it to the threshold for desorption, taking into account the enhancement of the field at the dielectric-air interface. The results indicate that absorption of energy only occurs in the film. We then measure the beam radius in situ by the knife-edge technique and characterize the desorption by atomic force microscopy. The radius of the laser desorbed area is determined by the desorption threshold intensity and can be a factor of 5 smaller than the beam waist
Publication date
LanguageEnglish
AffiliationSecurity and Disruptive Technologies; National Research Council Canada
Peer reviewedYes
NPARC number21270339
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Record identifier389e40b7-1f07-4aab-a442-4bd554d30e97
Record created2014-01-30
Record modified2016-05-09
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