Selecting the polarization in silicon photonic wire components

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DOIResolve DOI: http://doi.org/10.1117/12.911368
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TypeArticle
Proceedings titleProceedings of SPIE - The International Society for Optical Engineering
ConferenceSilicon Photonics VII, 22 January 2012 through 25 January 2012, San Francisco, CA
ISSN0277-786X
ISBN9780819489098
Volume8266
Article number82660G
SubjectPolarization conversion; Polarization diversity; Polarization independence; Ring resonator; Silicon photonics; Birefringence; Directional couplers; Optical waveguides; Photonic devices; Waveguides; Polarization
AbstractSilicon photonic wire waveguides are usually highly birefringent, so they are generally designed to operate for one particular polarization. For commonly used waveguides with a silicon thickness of 220 nm, TE polarization is preferred since TM is only weakly guided. For waveguides with a silicon thickness larger than 250 nm, both TE and TM polarizations have been employed. Overall, the choice of polarization has largely appeared arbitrary. In this presentation we review the pertinent polarization-dependent waveguide properties, including losses, back-reflection, polarization conversion and fabrication tolerances, with the intent to suggest guidelines for choosing the proper polarization. Through experimental evidence, we show that TM polarization has several important advantages and can support high performance resonators with a radius down to 2 μm. © 2012 SPIE.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada (NRC-CNRC); NRC Institute for Microstructural Sciences
Peer reviewedYes
NPARC number21269566
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Record identifier3b939b0e-9e10-4357-9c76-b333d05bdc60
Record created2013-12-12
Record modified2016-05-09
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