Technique for fitting complex probes in nano-beam diffraction

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Proceedings titleMicroscopy and Microanalysis
ConferenceMicroscopy and Microanalysis 2009, 26-30 July 2009, Richmond, Virginia, USA
IssueSupplement S2
Pages768769; # of pages: 2
Publication date
PublisherCambridge University Press
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number21268177
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Record identifier3bd6afec-7867-4144-9a37-8da54b6da889
Record created2013-05-21
Record modified2016-05-09
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