Extraction of depth-dependent perturbation factors for silicon diodes using a plastic scintillation detector

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DOIResolve DOI: http://doi.org/10.1118/1.3637496
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TypeArticle
Journal titleMedical Physics
ISSN0094-2405
Volume38
Issue10
Pages54415447; # of pages: 7
Subjectsilicon; algorithm; article; chemistry; computer assisted radiotherapy; computer simulation; electron; human; megavoltage radiotherapy; methodology; Monte Carlo method; radiation dose; radiation response; radiometry; reproducibility; scintillation counting; Algorithms; Computer Simulation; Dose-Response Relationship, Radiation; Electrons; Humans; Monte Carlo Method; Radiometry; Radiotherapy Dosage; Radiotherapy Planning, Computer-Assisted; Radiotherapy, High-Energy; Reproducibility of Results; Scintillation Counting; Silicon
AbstractPurpose: This work presents the experimental extraction of the perturbation factor in megavoltage electron beams for three models of silicon diodes (IBA Dosimetry, EFD and SFD, and the PTW 60012 unshielded) using a plastic scintillation detector (PSD). Methods: The authors used a single scanning PSD mounted on a high-precision scanning tank to measure depth-dose curves in 6-, 12-, and 18-MeV clinical electron beams. They also measured depth-dose curves using the IBA Dosimetry, EFD and SFD, and the PTW 60012 unshielded diodes. The authors used the depth-dose curves measured with the PSD as a perturbation-free reference to extract the perturbation factors of the diodes. Results: The authors found that the perturbation factors for the diodes increased substantially with depth, especially for low-energy electron beams. The experimental results show the same trend as published Monte Carlo simulation results for the EFD diode; however, the perturbations measured experimentally were greater. They found that using an effective point of measurement (EPOM) placed slightly away from the source reduced the variation of perturbation factors with depth and that the optimal EPOM appears to be energy dependent. Conclusions: The manufacturer recommended EPOM appears to be incorrect at low electron energy (6 MeV). In addition, the perturbation factors for diodes may be greater than predicted by Monte Carlo simulations. © 2011 American Association of Physicists in Medicine.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada (NRC-CNRC); NRC Institute for National Measurement Standards (INMS-IENM)
Peer reviewedYes
NPARC number21271047
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Record identifier3c373f23-fb81-4869-b3fc-c99b3f4f0f6a
Record created2014-03-24
Record modified2016-05-09
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