Optimized Cs-corrected imaging of radiation-sensitive high-resolution objects

DOIResolve DOI: http://doi.org/10.1017/S1431927606067341
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TypeArticle
Proceedings titleMicroscopy and Microanalysis
ConferenceMicroscopy and Microanalysis 2006, 30 July-3 August 2005, Chicago, Illinois, USA
Volume12
IssueSupplement S02
Pages1458 CD1459 CD; # of pages: 2
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; National Institute for Nanotechnology
Peer reviewedYes
NPARC number12338025
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Record identifier3e4eda5d-a220-419d-a3b6-dfe9994dae3d
Record created2009-09-10
Record modified2016-05-09
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