Measurement of microwave frequency using a monolithically integrated scannable echelle diffractive grating

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DOIResolve DOI: http://doi.org/10.1109/LPT.2008.2008199
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TypeArticle
Journal titleIEEE Photonics Technology Letters
Volume21
Issue1
Pages4547; # of pages: 3
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada; NRC Institute for Aerospace Research
Peer reviewedNo
NPARC number12441132
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Record identifier41d6e4f2-2fa9-468b-b33a-dbefe00353d2
Record created2009-09-25
Record modified2016-05-09
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