Direct Imaging of the Depletion Region of an InP pn Junction Under Bias Using Scanning Voltage Microscopy

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DOIResolve DOI: http://doi.org/10.1063/1.1528277
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TypeArticle
Journal titleApplied Physics Letters
Volume81
Issue26
Pages50575059; # of pages: 3
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744750
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Record identifier42003d2c-25a0-447c-aa44-1baca85c6dbb
Record created2009-10-27
Record modified2016-05-09
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