Transmission electron microscopy investigation of interfacial reactions between SrFeO3 thin films and silicon substrates

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DOIResolve DOI: http://doi.org/10.1557/JMR.2007.0005
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TypeArticle
Journal titleJournal of Materials Research
Volume22
Issue1
Pages7688; # of pages: 13
Subjectinterfacial reactions; thin films; silicon substrates; pulsed laser deposition
Publication date
PublisherMaterials Research Society
LanguageEnglish
AffiliationNRC Institute for Chemical Process and Environmental Technology (ICPET-ITPCE); National Research Council Canada
Access conditionavailable
unlimited
public
Peer reviewedYes
NRC number51693
NPARC number9073357
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Record identifier428ecab3-f032-48c7-ba88-dba16b5b2765
Record created2009-10-03
Record modified2016-05-09
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