Scanning tunneling microscopy images of IIIV semiconductor alloys: strain effects

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DOIResolve DOI: http://doi.org/10.1116/1.1529651
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TypeArticle
Journal titleJournal of Vacuum Science & Technology B
Volume21
Issue1
Pages1822; # of pages: 5
Publication date
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
NPARC number12744628
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Record identifier42ca7a48-84ae-449f-bdf0-b8382f3bc569
Record created2009-10-27
Record modified2016-05-09
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