Femtosecond laser desorption of thin polymer films from a dielectric surface

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DOIResolve DOI: http://doi.org/10.1051/matecconf/20130802004
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TypeArticle
Proceedings titleMATEC Web of Conferences
ConferenceWorkshop on Progress in Ultrafast Laser Modifications of Materials, 2013, 14 April 2013 through 19 April 2013, Cargese
ISSN2261-236X
Volume8
Article number2004
SubjectAtomic force microscopy; Polymer films; Semiconducting films; Ultrashort pulses; Beam geometry; Dielectric surface; Thin polymer films; Two ways; Ultrafast lasers
AbstractWe desorb polymer films from fused silica with a femtosecond laser and characterize the results by atomic force microscopy. Our study as a function of beam geometry and energy reveals two ways of achieving spatially controlled nanodesorption. © Owned by the authors, published by EDP Sciences, 2013.
Publication date
LanguageEnglish
AffiliationSecurity and Disruptive Technologies; National Research Council Canada
Peer reviewedYes
NPARC number21276253
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Record identifier431c2f5d-db1a-43b8-9047-d755957db1c2
Record created2015-09-28
Record modified2016-05-09
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