Growth and characterization of Si---Ge atomic layer superlattices

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DOIResolve DOI: http://doi.org/10.1016/0040-6090(89)90425-2
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TypeArticle
Journal titleThin solid films
ISSN0040-6090
Volume183
IssueDecember 30,
Pages1724; # of pages: 8
Publication date
LanguageEnglish
AffiliationNRC Institute for National Measurement Standards; NRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedNo
Identifier10276968
NRC number1118
NPARC number8897217
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Record identifier4343091b-e661-4e53-821f-b191a857bfd0
Record created2009-04-22
Record modified2016-05-09
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