Origin of carbon and its influence on photoluminescence in porous silicon

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DOIResolve DOI: http://doi.org/10.1016/0038-1098(94)00777-2
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TypeArticle
Journal titleSolid State Communications
Volume93
Issue10
Pages833836; # of pages: 4
SubjectA. nanostructures; A. semiconductors; D. optical properties; E. ion impact
AbstractSamples of porous Si (PS) were prepared from p-type 10-35 [Omega]-cm Si under anodisation in aqueous HF (20%) for 10 min. The composition of the PS was measured by heavy-ion elastic recoil detection analysis (HIERDA). In all samples a considerable carbon content varying from 2-20% was measured, while the oxygen and hydrogen concentrations ranged from 2-25% and 10-25%, respectively. The sample wax removing procedure was identified as a source for the high carbon content. The concentration of carbon and its influence on the photoluminescence due to different treatments of PS was investigated.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; NRC Institute for Microstructural Sciences
Peer reviewedNo
NPARC number12333664
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Record identifier43b5122a-8cbe-48b6-b74a-dc86494266d8
Record created2009-09-10
Record modified2016-05-09
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