Surface chemistry of end cuts from Athabasca bitumen

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DOIResolve DOI: http://doi.org/10.1002/1096-9918(200008)
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TypeArticle
Journal titleSurface and Interface Analysis
Volume30
Issue1
Pages207211; # of pages: 5
SubjectBitumen; End cut; Surface; XPS; ToF-SIMS; FTIR
AbstractBitumen components, responsible for various processing problems, were analysed with x-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS) and photoacoustic Fourier transform infrared spectrometry (PAS–FTIR). These methods were selected because they can probe surfaces to different depths: ToF-SIMS explores the surface to a depth of ~1 nm; XPS analyses a surface layer 7 nm deep; and PAS–FTIR probes layers several micrometres thick.
Publication date
LanguageEnglish
AffiliationNational Research Council Canada; NRC Institute for Chemical Process and Environmental Technology
Peer reviewedNo
NRC number51877
NPARC number13063727
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Record identifier465d9a4c-2ed8-41ed-b3b0-12585e80eb1d
Record created2009-12-03
Record modified2016-05-09
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